A marked point process of rectangles and segments for automatic analysis of Digital Elevation Models - INRIA - Institut National de Recherche en Informatique et en Automatique Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Pattern Analysis and Machine Intelligence Année : 2008

A marked point process of rectangles and segments for automatic analysis of Digital Elevation Models

Mathias Ortner
  • Fonction : Auteur
  • PersonId : 1109838
  • IdRef : 085765023
Xavier Descombes
Josiane Zerubia
  • Fonction : Auteur
  • PersonId : 833424

Résumé

This work presents a framework for automatic feature extraction from images using stochastic geometry. Features in images are modeled as realizations of a spatial point process of geometrical shapes. This framework allows the incorporation of a priori knowledge on the spatial repartition of features. More specifically, we present a model based on the superposition of a process of segments and a process of rectangles. The former is dedicated to the detection of linear networks of discontinuities, while the latter aims at segmenting homogeneous areas. An energy is defined, favoring connections of segments, alignments of rectangles, as well as a relevant interaction between both types of objects. The estimation is performed by minimizing the energy using a simulated annealing algorithm. The proposed model is applied to the analysis of Digital Elevation Models (DEMs). These images are raster data representing the altimetry of a dense urban area. We present results on real data provided by the IGN (French National Geographic Institute) consisting in low quality DEMs of various types.
Fichier principal
Vignette du fichier
ortner08.pdf (1.27 Mo) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

inria-00278882 , version 1 (14-05-2008)

Identifiants

Citer

Mathias Ortner, Xavier Descombes, Josiane Zerubia. A marked point process of rectangles and segments for automatic analysis of Digital Elevation Models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2008, 30 (1), pp.105-119. ⟨10.1109/TPAMI.2007.1159⟩. ⟨inria-00278882⟩
122 Consultations
445 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More