Smart selection of indirect parameters for DC-based alternate RF IC testing

Haithem Ayari (1) , Florence Azaïs (2) , Serge Bernard (3) , Mariane Comte (2) , Michel Renovell (2) , Vincent Kerzérho (2) , Olivier Potin (1) , Christophe Kelma (4)

1 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
3 DEMAR - Artificial movement and gait restoration
4 NXP Semiconductors

In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC parameters is presented, that allows precise estimation of the DUT performances while minimizing the number of measurements to be carried out. The method is demonstrated both on simulation test data from a Low-Noise Amplifier (LNA) and production test data from a Power Amplifier (PA). Results indicate that good prediction of the RF performances can be achieved using only a reduced number of DC measurements.

Mots clés: power amplifiers; radiofrequency integrated circuits; DC measurement; DC-based alternate RFIC testing; DUT performance; LNA; low-noise amplifier; power amplifier; production test data; simulation test data; smart selection; Accuracy; Context; Performance evaluation; Production; Radio frequency; Semiconductor device measurement; Testing; DC measurements; RF integrated circuits; Test; alternate test; test compaction; Mots-clés : integrated circuit testing; low noise amplifiers

Domaines: Micro et nanotechnologies/Microélectronique

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, et al.. Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩. ⟨lirmm-00803453⟩