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Communication Dans Un Congrès Année : 2007

SiGe HBT Nonlinear Phase Noise Modeling

Résumé

A nonlinear noise model of a SiGe bipolar transistor is presented. This model includes nonlinear noise sources and is able to predict the noise conversion phenomena in circuits using this transistor and as the phse noise of an oscillator. It is based on two main low frequency noise sources, which are extracted thanks to noise measurements under large RF signal superposition. The model is compared to the experiment thanks to residual phase noise data at different RF power level.
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Dates et versions

hal-00177082 , version 1 (05-10-2007)

Identifiants

  • HAL Id : hal-00177082 , version 1

Citer

Sébastien Gribaldo, Laurent Bary, Olivier Llopis. SiGe HBT Nonlinear Phase Noise Modeling. 19th International Conference on Noise and Fluctuations - ICNF 2007, Sep 2007, Tokyo, Japan. pp.91-94. ⟨hal-00177082⟩
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