Phase noise measurement of a narrow linewidth CW laser using delay lines approaches

Olivier Llopis (1) , Pierre-Henri Merrer (1) , Houda Brahimi (1) , Khaldoun Saleh (1) , Pierre Lacroix (2)

1 LAAS-MOST - Équipe Microondes et Opto-microondes pour Systèmes de Télécommunications
2 LAAS-II

Two different laser phase noise measurement techniques are compared. One of these two techniques is based on a conventional and low cost delay line system which is usually set up for the linewidth measurement of semiconductor lasers. The results obtained with both techniques on a high spectral purity laser agree well and confirm the interest of the low cost technique. Moreover, an extraction of the laser linewidth using CAD tools is performed.

Mots clés: laser; phase noise; frequency noise; linewidth; metrology; optical delay line

Domaines: Micro et nanotechnologies/Microélectronique

Olivier Llopis, Pierre-Henri Merrer, Houda Brahimi, Khaldoun Saleh, Pierre Lacroix. Phase noise measurement of a narrow linewidth CW laser using delay lines approaches. Optics Letters, 2011, 36 (14), p.2713-2715. ⟨hal-00609221⟩