Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation

P. Donnadieu (1) , Y. Shao , G. Botton (2) , S. Lazar (2, 3) , M. Cheynet (1) , F. de Geuser (1, 4) , A. Deschamps (1) , Joël Douin (5) , Christophe Gatel , Florent Houdellier (5)

1 SIMaP - Science et Ingénierie des Matériaux et Procédés
2 CCEM
3 FEI company
4 Dept. of Mat. Engn, ARC Ctr Excellence Design Light Met,
5 CEMES - Centre d'élaboration de matériaux et d'études structurales

Domaines: Matériaux

P. Donnadieu, Y. Shao, G. Botton, S. Lazar, M. Cheynet, et al.. Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation. PTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France. ⟨hal-00610638⟩