Characterization of the Evolution of IC Emissions after Accelerated Aging

Alexandre Boyer (1) , Amadou Ndoye Cisse (2) , Sonia Ben Dhia (1) , Laurent Guillot (3) , Bertrand Vrignon (3)

1 LAAS - Laboratoire d'analyse et d'architecture des systèmes
2 LATTIS - Laboratoire Toulousain de Technologie et d'Ingénierie des Systèmes
3 Freescale Semiconductor

With the evolving technological development of integrated circuits (ICs), ensuring electromagnetic compatibility (EMC) is becoming a serious challenge for electronic circuit and system manufacturers. Although electronic components must pass a set of EMC tests to ensure safe operations, the evolution over time of EMC is not characterized and cannot be accurately forecast. This paper presents an original study about the consequences of the aging of circuits on electromagnetic emission. Different types of standard applicative and accelerated-life tests are applied on a mixed power circuit dedicated to automotive applications. Its conducted emission is measured before and after these tests showing variations in EMC performances. Comparisons between each type of aging procedure show that the emission level of the circuit under test is affected differently.

Mots clés: Integrated circuit testing; electromagnetic compatibility; conducted emission; aging effects

Domaines: Electronique

Alexandre Boyer, Amadou Ndoye Cisse, Sonia Ben Dhia, Laurent Guillot, Bertrand Vrignon. Characterization of the Evolution of IC Emissions after Accelerated Aging. IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (4), pp.892. ⟨hal-00669519⟩