Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors

Jian-Fei Wu (1) , Etienne Sicard (2) , Alexandre Boyer (3) , Sonia Ben Dhia (3) , Jiancheng Li (1) , Rongjun Shen (1)

1 School of Electronic Science and Engineering
2 INSA Toulouse - Institut National des Sciences Appliquées - Toulouse
3 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie

Presented is a new test method that consists in monitoring on-chip internal voltages during susceptibility tests of integrated circuits. An on-chip sensor was installed at several internal nodes within low dropout regulators to measure the distortion of internal signals induced by the coupling of electromagnetic interference. The comparison between external and internal measurement results shows that on-chip sensor techniques enhance the extraction of circuit susceptibility levels, especially at high frequencies.

Mots clés: Electromagnetic susceptibility; Integrated circuits; Low dropout voltage regulator; On-chip sensor

Domaines: Electronique

Jian-Fei Wu, Etienne Sicard, Alexandre Boyer, Sonia Ben Dhia, Jiancheng Li, et al.. Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors. Electronics Letters, 2012, 48 (11), pp.649-650. ⟨10.1049/el.2012.0407⟩. ⟨hal-00709287⟩