A simple and versatile method for statistical analysis of the electrical properties of individual double walled carbon nanotubes

Florent Seichepine (1, 2) , Emmanuel Flahaut (1) , Christophe Vieu (3)

1 CIRIMAT - Centre interuniversitaire de recherche et d'ingenierie des matériaux
2 LAAS - Laboratoire d'analyse et d'architecture des systèmes
3 LAAS-NBS - Équipe NanoBioSystèmes

Double-walled carbon nanotubes (DWNTs) are potential candidates for new generation of on chip interconnections due to their nearly metallic behaviour. For such large scale integration purpose it is mandatory to characterize their electrical properties in a statistical way. We thus propose a new methodology for characterizing in one step, the electrical properties of a large population of nanotubes. The method enables to obtain histograms of the conductance and maximum current density of individual nanoobjects.

Mots clés: Large scale integration; Current density; Nanomaterial; Nanoelectronic; Carbon nanotube; Interconnection

Domaines: Algorithme et structure de données [cs.DS]; Matériaux

Florent Seichepine, Emmanuel Flahaut, Christophe Vieu. A simple and versatile method for statistical analysis of the electrical properties of individual double walled carbon nanotubes. Microelectronic Engineering, 2011, 88 (7), pp. 1637-1639. ⟨10.1016/j.mee.2011.01.081⟩. ⟨hal-00828791⟩