Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits

Alexandre Boyer (1) , Sonia Ben Dhia (1) , Binhong Li (2) , Nestor Berbel (3) , Raul Fernandez-Garcia (3)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
2 Institute of Microelectronics
3 UPC - Universitat Politècnica de Catalunya = Université polytechnique de Catalogne [Barcelona]

Recent studies have shown that the aging of integrated circuits may modify electromagnetic emission significantly. This paper reports on an experiment to elucidate the origins of emission level changes in a test chip using 90 nm CMOS technology. Circuit analysis, combined with electromagnetic emission and on-chip power supply voltage bounce measurements made during the application of electric stress, have identified the role of intrinsic wear-out mechanisms which contribute to a progressive change in the transient current produced by the circuit.

Mots clés: Electromagnetic emission; integrated circuits; semiconductor device reliability; aging effects

Domaines: Electronique

Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Nestor Berbel, Raul Fernandez-Garcia. Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits. IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (1), pp. 44-50. ⟨10.1109/TEMC.2013.2272195⟩. ⟨hal-00937775⟩