Tackling the challenges of System level ESD: from efficient ICs ESD protection to system level predictive modeling

Marise Bafleur (1) , Fabrice Caignet (1) , Nicolas Nolhier (1) , David Trémouilles (2)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
2 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie

This paper provides a review of the main tools that will allow developing a system efficient ESD design (SEED) approach. It starts with copying with the challenges of the narrowing of the ESD design window with temperature and high-voltage I/Os. We then present our behavioral modeling approach using VHDL-AMS and characterization tools such as TLP testing. Finally, the efficiency of the modeling methodology is illustrated with three case studies.

Mots clés: system level ESD; Human Metal Model; behavioral modeling; VHDL-AMS; ESD protection

Domaines: Micro et nanotechnologies/Microélectronique

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier, David Trémouilles. Tackling the challenges of System level ESD: from efficient ICs ESD protection to system level predictive modeling. Taiwan ESD and Reliability Conference, Nov 2013, Hsinchu, Taiwan. ⟨hal-00957728⟩