Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for III-V photonics platform on silicon

Yanping Wang (1) , Antoine Létoublon (1) , Thanh Tra Nguyen (2) , Julien Stodolna (3) , Nicolas Bertru (1) , Alain Le Corre (1) , Anne Ponchet (3) , C. Magen (4) , Nathalie Boudet (2) , Jean-Sébastien Micha (5) , Jacky Even (1) , Charles Cornet (1) , Olivier Durand (1)

1 FOTON - Fonctions Optiques pour les Technologies de l'informatiON
2 ESRF - European Synchrotron Radiation Facility
3 CEMES - Centre d'élaboration de matériaux et d'études structurales
4 Universidad de Zaragossa
5 SPRAM - UMR 5819 - Structures et propriétés d'architectures moléculaire

Domaines: Matériaux

Yanping Wang, Antoine Létoublon, Thanh Tra Nguyen, Julien Stodolna, Nicolas Bertru, et al.. Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for III-V photonics platform on silicon. 12th Biennal Conference on High-Resolution X-Ray Diffraction and Imaging, Sep 2014, Villard de Lans, France. ⟨hal-01115004⟩