Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends

Alexandre Boyer (1) , Sonia Ben Dhia (1)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués

Electromagnetic compatibility (EMC) is an essential requirement to electronic systems in which integrated circuits have a major influence. Intrinsic degradation mechanisms, which produces anticipated wear-out in deep submicron (DSM) components threat not only the reliability of circuits, but also EMC performances. The need to predict and ensure long-term EMC has become a key challenge. This paper aims at presenting the last results on the long-term EMC topic, with a special focus on DSM components. The paper clarifies the effect of device degradation mechanisms on EMC level drifts during lifetime and present some attempts to predict these evolutions.

Mots clés: deep submicron circuit; electromagnetic compatibility; reliability; modeling

Domaines: Electronique

Alexandre Boyer, Sonia Ben Dhia. Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends. Minapad Forum 2015, Apr 2015, Grenoble, France. 6p. ⟨hal-01159227⟩