Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter

He Huang (1) , Alexandre Boyer (1) , Sonia Ben Dhia (1)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués

Past works showed that the degradation of the passive devices caused by aging could induce failures of electronic system, including a harmful evolution of electromagnetic compatibility. This paper presents the impact of accelerated aging conditions on several typical passive components (capacitor, inductor). The preliminary degradation models of electrolytic capacitor and powder iron inductor are proposed based on experimental results and physical analysis. The overall objective of this study is to predict the evolution of electromagnetic emission level produced by a buck DC-DC converter under a thermal aging, by using these passive device degradation models.

Mots clés: passive device; electromagnetic emission; accelerated aging; degradation modeling

Domaines: Electronique

He Huang, Alexandre Boyer, Sonia Ben Dhia. Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter. EMC Europe 2015, Aug 2015, Dresden, Germany. 6p. ⟨hal-01225350⟩