Predicting the risk of non-compliance to EMC requirements during the life-cycle

Alexandre Boyer (1) , He Huang (1) , Sonia Ben Dhia (1)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués

This paper presents a simulation flow for the prediction of the long-term evolution of EMC levels during the lifetime of electronic devices or systems. This new requirement is essential to extend the warranty of critical applications operating in harsh environments. The simulation of the evolution of the electromagnetic emission of a switched-mode power supply is given as a validation case.

Domaines: Electronique

Alexandre Boyer, He Huang, Sonia Ben Dhia. Predicting the risk of non-compliance to EMC requirements during the life-cycle. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.452 - 455, ⟨10.1109/APEMC.2016.7522766⟩. ⟨hal-01403875⟩