Surface temperature measurement for space charge distribution measurements with thermal methods

C. Filloy-Corbrion (1) , C. Boue (1) , E. Géron (2) , T. Ditchi (1) , J. Lucas (1) , S. Hole (1) , Petru Notingher (3) , S. Agnel (3) , Didier Marty-Dessus (4) , Laurent Berquez (4) , G. Teyssedre (4)

1 LPEM - Laboratoire de Physique et d'Etude des Matériaux (UMR 8213)
2 ESPCI Paris - Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris
3 IES - Institut d’Electronique et des Systèmes
4 LAPLACE-DSF - Diélectriques Solides et Fiabilité

The implementation of space charge measurements based on thermal perturbation on thin films requires an improvement of the temperature distribution estimation at the surface and in the depth of dielectric materials for getting reliable space charge profile measurements. Absolute temperature variations are needed, both in time and space. The present contribution addresses surface temperature measurements based on either thermoelectric or bolometric effects. Both responses have been measured on copper-coated silicon nitride layers and gold-coated polypropylene films heated with a Nd:YAG laser pulse. It is shown that high temporal resolution thermal response can be obtained through the bolometric response and that the information appears nearly independent on the nature of the coating electrode. The setup developed provides good signal to noise ratio for heated electrodes of a few ohm resistance. Strategies are still to develop to get the temperature profile in the insulating sample layer.

Mots clés: space charges; thermal measurement method; spatial resolution; surface temperature

Domaines: Electronique

C. Filloy-Corbrion, C. Boue, E. Géron, T. Ditchi, J. Lucas, et al.. Surface temperature measurement for space charge distribution measurements with thermal methods. IEEE Transactions on Dielectrics and Electrical Insulation, 2015, 22 (3), pp.1506-1511. ⟨10.1109/TDEI.2015.7116345⟩. ⟨hal-01629260⟩