Quantitative Mapping of Nano-Dielectrics with Electrostatic Force Microscopy

Richard Arinero (1, 2) , Gaëtan Lévêque (1) , C. Riedel (1) , Philippe Tordjeman (3) , J. Colmenero (4, 5) , A. Alegria (4, 5, 6) , G. A. Schwartz (5)

1 IES - Institut d’Electronique et des Systèmes
2 NANOMIR - Composants à Nanostructure pour le moyen infrarouge
3 IMFT - Institut de mécanique des fluides de Toulouse
4 Materials Physics Center CSIC-UPV/EHU and Donostia International Physics Center, San Sebastián, Spain
5 CFM - Centro de Fisica de Materiales
6 Donostia International Physics Center - DIPC (SPAIN)

e present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy by means of the double pass method. The EFM experiments are based on the measurement of the frequency shifts of the oscillating tip biased at two different voltages. A numerical treatment based on the equivalent charge method allows extracting the values of the dielectric permittivity at each image point.

Mots clés: nanostructures; polymers; imaging; nanoscale; glass transition; poly-; local properties; dielectric; mer

Domaines: Electronique

Richard Arinero, Gaëtan Lévêque, C. Riedel, Philippe Tordjeman, J. Colmenero, et al.. Quantitative Mapping of Nano-Dielectrics with Electrostatic Force Microscopy. Microscopy and Analysis, 2010, 24, pp.9 - 11. ⟨hal-01631768⟩