Metrological Analysis of the DIC Ultimate Error Regime

Michel Bornert (1) , Pascal Doumalin (2) , Jean-Christophe Dupré (2) , Christophe Poilane (3) , Laurent Robert (4) , Evelyne Toussaint (5) , Bertrand Wattrisse (6)

1 navier umr 8205 - Laboratoire Navier
2 PPrime [Poitiers] - Institut Pprime [UPR 3346]
3 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique
4 ICA - Institut Clément Ader
5 IP - Institut Pascal
6 ThM2 - ThermoMécanique des Matériaux

In DIC, the “ultimate error regime” corresponds to situations for which the shape function used to describe the material transformation perfectly matches the actual one. We propose to confront results obtained from numerically-shifted images with the predictions of theoretical models developed in the literature to describe bias and random error evolutions with respect to the imposed displacement. Results show the overall good predictions of these models but small deviations arise, mainly around integer values of imposed displacements for noisy images. These deviations are interpreted as the unrepresentativeness of the underlying hypotheses of the theoretical models in these particular cases.

Mots clés: Ultimate Error; Digital Image Correlation; Metrology

Domaines: Traitement du signal et de l'image [eess.SP]

Michel Bornert, Pascal Doumalin, Jean-Christophe Dupré, Christophe Poilane, Laurent Robert, et al.. Metrological Analysis of the DIC Ultimate Error Regime. 1st Annual International Digital Imaging Correlation Society Conference, Digital Imaging Correlation Society, Nov 2016, Philadelphie, PA, United States. pp.191-193, ⟨10.1007/978-3-319-51439-0_45⟩. ⟨hal-01633706⟩