On the “Life” of {113} Defects

Nikolay Cherkashin (1) , P. Calvo (1) , Fuccio Cristiano (2) , B. de Mauduit (1) , Alain Claverie (1)

1 CEMES-MEM - Matériaux et dispositifs pour l'Electronique et le Magnétisme
2 LAAS-MPN - Équipe Matériaux et Procédés pour la Nanoélectronique

In this paper, we present a new set of conditions which can be used for imaging {113} defects. These conditions have the advantage of allowing the simultaneous imaging of all the variants of the defects. They can be used for building up accurate size-histograms or for checking the occurrence of the different variants. Making use of these conditions, we revisit the well- known experiments of the dissolution of the {113} defects and pinpoint some specific features of defect evolution during annealing which were not evidenced in previous works. The new results are discussed and are definitely found to be well-explained in the framework of a non- conservative Ostwald ripening.

Domaines: Physique [physics]

Nikolay Cherkashin, P. Calvo, Fuccio Cristiano, B. de Mauduit, Alain Claverie. On the “Life” of {113} Defects. MRS Proceedings, 2004, 810, pp.103-108. ⟨10.1557/PROC-810-C3.7⟩. ⟨hal-01736093⟩