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Article Dans Une Revue Ultramicroscopy Année : 2017

200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy

Résumé

We report the use of a pyrolytic carbon cone nanotip as field emission cathode inside a modern 200 kV dedicated scanning transmission electron microscope. We show an unprecedented improvement in the probe current stability while maintaining all the fundamental properties of a cold field emission source such as a small angular current density together with a high brightness. We have also studied the influence of the low extraction voltage, as enabled by the nanosized apex of the cones, on the electron optics properties of the source that prevent the formation of a virtual beam cross-over of the gun. We have addressed this resolution-limiting issue by coming up with a new electron optical source design.
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hal-01741769 , version 1 (23-03-2018)

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Shuichi Mamishin, Yudai Kubo, Robin Cours, Marc Monthioux, Florent Houdellier. 200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy. Ultramicroscopy, 2017, 182, pp.303 - 307. ⟨10.1016/j.ultramic.2017.07.018⟩. ⟨hal-01741769⟩
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