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Article Dans Une Revue Thin Solid Films Année : 1995

Physicochemical properties of SiC-based ceramics deposited by low pressure chemical vapor deposition from CH3SiCl3H2

Résumé

The physicochemical properties of SiC-based deposits, obtained from the thermal decomposition of CH3SiCl3(MTS) in hydrogen, under conditions of reduced pressure (P < 20 kPa) and low temperature (T < 1400 K), are studied. The morphology, the structure, the nainostructure and the chemical composition of the deposits are discussed from a kinetic and a thermodynamic point of view. They are closely related to the kinetic control regime (either mass transfer or chemical reactions). The silicon excess has a pronounced influence on the morphology and the nanostructure of the deposits.

Dates et versions

hal-01745064 , version 1 (27-03-2018)

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F Loumagne, F Langlais, R Naslain, Sylvie Schamm-Chardon, Dominique Dorignac, et al.. Physicochemical properties of SiC-based ceramics deposited by low pressure chemical vapor deposition from CH3SiCl3H2. Thin Solid Films, 1995, 254 (1-2), pp.75-82. ⟨10.1016/0040-6090(94)06237-F⟩. ⟨hal-01745064⟩
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