Strain measurements and mapping with a nanometer resolution and high precision at the most basic conventional TEM: moiré based technique by specimen design - Université Toulouse III - Paul Sabatier - Toulouse INP Accéder directement au contenu
Communication Dans Un Congrès Année : 2018

Strain measurements and mapping with a nanometer resolution and high precision at the most basic conventional TEM: moiré based technique by specimen design

Nikolay Cherkashin
Matériaux et dispositifs pour l'Electronique et le Magnétisme
CV

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Physique [physics]

Isabelle Labau  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-01763087

Soumis le : mardi 10 avril 2018-16:59:07

Dernière modification le : jeudi 11 avril 2024-13:08:15

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hal-01763087 , version 1 (10-04-2018)

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  • HAL Id : hal-01763087 , version 1

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Nikolay Cherkashin. Strain measurements and mapping with a nanometer resolution and high precision at the most basic conventional TEM: moiré based technique by specimen design. Energy Materials Nanotechnology (EMN 2018), May 2018, Heraklion, Greece. ⟨hal-01763087⟩

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