Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy

Richard Arinero (1, 2) , C. Riedel (1) , Gustavo A. Schwartz (3) , Gérard Leveque (1) , A. Alegria (4) , Philippe Tordjeman (5) , N. E. Israeloff (6) , Michel Ramonda (1) , J. Colmenero (4)

1 IES - Institut d’Electronique et des Systèmes
2 NANOMIR - Composants à Nanostructure pour le moyen infrarouge
3 UPV / EHU - University of the Basque Country = Euskal Herriko Unibertsitatea
4 Materials Physics Center CSIC-UPV/EHU and Donostia International Physics Center, San Sebastián, Spain
5 IMFT - Institut de mécanique des fluides de Toulouse
6 Northeastern University [Boston]

Domaines: Sciences de l'ingénieur [physics]

Richard Arinero, C. Riedel, Gustavo A. Schwartz, Gérard Leveque, A. Alegria, et al.. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). A. Méndez-Vilas and J. Díaz (Eds.) p 1963-1977, 2010, 978-84-614-6191-2. ⟨hal-01791128⟩