Quantitative Dielectric Mapping of Nano-structured Systems by Means of Electrostatic Force Microscopy - Université Toulouse III - Paul Sabatier - Toulouse INP Accéder directement au contenu
Communication Dans Un Congrès Année : 2010
Fichier non déposé

Dates et versions

hal-01813969 , version 1 (12-06-2018)

Identifiants

  • HAL Id : hal-01813969 , version 1

Citer

Gustavo Ariel Schwartz, Richard Arinero, Clément Riedel, Philippe Tordjeman, Angel Alegría, et al.. Quantitative Dielectric Mapping of Nano-structured Systems by Means of Electrostatic Force Microscopy. The 12th International Scanning Probe Microscopy (ISPM) Conference, May 2010, Sapporo, Japan. ⟨hal-01813969⟩
65 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More