Reversibility of defect formation during oxygen-assisted electron-beam-induced etching of graphene

Guillaume Pillet (1) , Victor Freire-Soler (2) , Marc Nuñez Eroles (2) , Wolfgang Bacsa (1) , Erik Dujardin (2) , Pascal Puech (1)

1 CEMES-M3 - Matériaux Multi-fonctionnels et Multi-échelles
2 CEMES-GNS - Groupe NanoSciences

Domaines: Matière Condensée [cond-mat]; Matériaux

Guillaume Pillet, Victor Freire-Soler, Marc Nuñez Eroles, Wolfgang Bacsa, Erik Dujardin, et al.. Reversibility of defect formation during oxygen-assisted electron-beam-induced etching of graphene. Journal of Raman Spectroscopy, 2018, 49 (2), pp.317 - 323. ⟨10.1002/jrs.5287⟩. ⟨hal-01866089⟩