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Integration and Electrical Characterization of Indium-Oxide Nanoparticles in Oxide Resistive Random-Access Memories

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Conference papers
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https://hal.archives-ouvertes.fr/hal-02079236
Contributor : Umi3463 Ln2 <>
Submitted on : Monday, March 25, 2019 - 7:36:07 PM
Last modification on : Wednesday, February 10, 2021 - 10:38:05 AM

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  • HAL Id : hal-02079236, version 1

Citation

A. Souifi, E. Cossec, K. Hamga, P.-V. Guenery, M. Troudi, et al.. Integration and Electrical Characterization of Indium-Oxide Nanoparticles in Oxide Resistive Random-Access Memories. CMOS Emerging Technologies, May 2016, Montreal, Canada. ⟨hal-02079236⟩

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