P. Morshuis, Interfaces: to be avoided or to be treasured, Proc; IEEE International Conference on Solid Dielectrics, 2013.

L. Chen, T. D. Huan, Y. Quintero, and R. Ramprasad, Charge injection barriers at metal/polyethylene interfaces, J. Mater. Sci, vol.51, p.506, 2016.

L. Chen, T. D. Huan, and R. Ramprasad, Electronic structure of polyethylene: Role of chemical, morphological and interfacial complexity, Scientific Reports, vol.7, p.6128, 2017.

I. Plesa, P. V. Notingher, S. Schlogl, C. Sumereder, and M. Muhr, Properties of polymer composites used in high-voltage applications, Polymers, vol.8, p.173, 2016.

M. Ishii, Static states and dynamic behavior of charges: observation and control by scanning probe microscopy, J. Phys.: Cond. Matter, vol.22, p.173001, 2010.

C. A. Rezende, R. F. Gouveia, M. A. Silva, and F. Galembeck, Detection of charge distributions in insulator surfaces, J. Phys.: Condens. Matter, vol.21, p.263002, 2009.

E. Pallau, L. Ressier, L. Borowik, and T. Melin, Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy, Nanotechnology, vol.21, p.225706, 2010.

W. R. Silveira and J. A. Marohn, Microscopic view of charge injection in an organic semiconductor, Phys. Rev. Lett, vol.93, p.116104, 2004.

J. Lambert, G. De-loubens, C. Guthmann, and M. Saint-jean, Dispersive charge transport along the surface of an insulating layer observed by electrostatic force microscopy, Phys. Rev. B, vol.71, p.155418, 2005.
URL : https://hal.archives-ouvertes.fr/hal-00126247

C. Villeneuve-faure, L. Boudou, K. Makasheva, and G. Teyssedre, Methodology for extraction of space charge density profiles at nanoscale from Kelvin Probe Force Microscopy measurements, Nanotechnology, vol.28, p.505701, 2017.
URL : https://hal.archives-ouvertes.fr/hal-02324308

K. Faliya, H. Kliem, and J. C. Dias, Space charge measurements with Kelvin Probe Force Microscopy, IEEE Trans. Dielec. Electr. Insul, vol.24, p.1913, 2017.

C. Villeneuve-faure, L. Boudou, K. Makasheva, and G. Teyssedre, Atomic force microscopy developments for probing space charge at sub micrometer scale in thin dielectric films, IEEE Trans. Dielec. Electr. Insul, vol.23, p.713, 2016.

S. L. Roy, C. Villeneuve-faure, J. H. Chang, and A. Huzayyin, Coupling molecular modeling, fluid modeling, and KPFM measurements to characterize an interface at nanoscale, Proc. IEEE International Conference on Dielectrics (ICD), p.897, 2016.

F. Gullo, T. Christen, C. Villeneuve-faure, C. Törnkvist, S. L. Roy et al., Nano-scale characterization of dielectric-semicon contacts, Proc. IEEE International Conference on Dielectrics (ICD), p.796, 2016.