N. H. Ahmed and N. N. Srinivas, Review of space charge measurements in dielectrics, IEEE Trans. Dielectr. Electr. Insul, vol.4, pp.644-656, 1997.

, Current meas ? Laurent

A. Ghetti, Gate Oxide Reliability: Physical and Computational Models, pp.201-258, 2004.

A. Martin, P. O'sullivan, and A. Mathewson, Dielectric reliability measurement methods: a review, Microelectron. Reliab, vol.38, pp.37-72, 1998.

J. F. Verweij and J. H. Klootwijk, Dielectric breakdown I: A review of oxide breakdown, Microelectronics J, vol.27, pp.611-622, 1996.

R. Foissac, S. Blonkowski, M. Kogelschatz, and P. Delcroix, A relationship between statistical time to breakdown distribution and prebreakdown negative differentiel resistance at nanometric scale, J. Appl. Phys, vol.116, p.24505, 2014.

O. Reid, K. Munechika, and D. S. Ginger, Space charge limited current measurements on conjugated polymer film using conductive Atomic Force Microscopy, Nano Lett, vol.8, pp.1602-1609, 2008.

G. C. Stevens and P. J. Baird, Nano and Meso measurement methods in the study of dielectrics, IEEE Trans. Dielectr Electr. Insul, vol.12, pp.979-992, 2005.

C. Schönenberger and S. Alvarado, Observation of signle charge carriers by force microscopy, Phys. Rev. Lett, vol.65, pp.3162-3164, 1990.

M. Ishii, Static states and dynamic behaviour of charges: observation and control by scanning probe microscopy, J. Phys.: Cond. Matter, vol.22, p.173001, 2010.

L. Nony, A. S. Foster, F. Bocquet, and C. Loppacher, Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy, Phys. Rev. Lett, vol.103, p.36802, 2009.
URL : https://hal.archives-ouvertes.fr/hal-00406631

L. Borowik, K. Kusiaku, D. Theron, and T. Melin, Calculating Kelvin force microscopy signals from static force field, Appl. Phys. Lett, vol.96, p.103119, 2010.

D. S. Charrier, M. Kemerik, B. E. Smalbrugge, T. Vries, and R. A. Janssen, Real versus measured surface potentials in scanning Kelvin probe microscopy, ACS Nano, vol.2, pp.622-626, 2008.

M. Jaquith, E. M. Muller, and J. A. Marohn, Time-resolved electrostatic force microscopy of charge trapping in polycristalline pentacene, J. Phys. Chem. B, vol.111, pp.7711-7714, 2007.

T. N. Ng, W. R. Silveira, and J. A. Marohn, Dependence of charge injection on temperature, electric field and energetic disorder in an organic semiconductor, Phys. Rev. Lett, vol.98, p.66101, 2007.

D. M. Taylor, D. Morris, and J. A. Cambridge, Time evolution of the electric field at electrode interfaces with conducting polymers, Appl. Phys. Lett, vol.85, pp.5266-5268, 2004.

W. R. Silveira and A. Marohn, Microscopic view of charge injection in an organic semiconductor, Phys. Rev. Lett, vol.93, p.116104, 2004.

U. Zaghloul, G. J. Papaioannou, F. Coccetti, P. Pons, and R. Plana, A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy, J. Micromech. Microeng, vol.20, p.64016, 2010.