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Article Dans Une Revue Journal of Low Temperature Physics Année : 2019

Niobium Nitride Thin Films for Very Low Temperature Resistive Thermometry

Résumé

We investigate thin film resistive thermometry based on metal-to-insulator-transition (niobium nitride) materials down to very low temperature. The variation of the NbN thermometer resistance have calibrated versus temperature and magnetic field. High sensitivity in tempertaure variation detection is demonstrated through efficient temperature coefficient of resistance. The nitrogen content of the niobium nitride thin films can be tuned to adjust the optimal working temperature range. In the present experiment, we show the versatility of the NbN thin film technology through applications in very different low temperature use-cases. We demonstrate that thin film re-sistive thermometry can be extended to temperatures below 30 mK with low electrical impedance.
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Dates et versions

hal-02334220 , version 1 (25-10-2019)

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Tuyen Thi Minh Nguyen, Adib Tavakoli, Sébastien Triqueneaux, Rahul Swami, Aki Ruhtinas, et al.. Niobium Nitride Thin Films for Very Low Temperature Resistive Thermometry. Journal of Low Temperature Physics, 2019, 197 (5-6), pp.348-356. ⟨10.1007/s10909-019-02222-6⟩. ⟨hal-02334220⟩
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