Dependence of the Field and Charge Distribution at a Semicon/Polyethylene Interface on the Press-Molding Process Derived from Kelvin Probe Force Microscopy

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https://hal.archives-ouvertes.fr/hal-02340262
Contributor : Severine Le Roy <>
Submitted on : Wednesday, October 30, 2019 - 5:25:26 PM
Last modification on : Friday, January 10, 2020 - 9:10:06 PM

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F. Gullo, T. Christen, C. Villeneuve-Faure, H. Hillborg, C. Laurent, et al.. Dependence of the Field and Charge Distribution at a Semicon/Polyethylene Interface on the Press-Molding Process Derived from Kelvin Probe Force Microscopy. 2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Oct 2018, Cancun, France. pp.469-472, ⟨10.1109/CEIDP.2018.8544910⟩. ⟨hal-02340262⟩

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