XPS profiling study of Al2O3 passivation layers for high efficiency n-PERT and PERC solar cells

Solène Béchu (1) , Anais Loubat (2) , Muriel Bouttemy (1) , Yves Marot (3) , Thomas Blévin (4) , Jonathan Langlois , Andy Zauner , Mathieu Frégnaux (1) , Damien Aureau (1) , Jackie Vigneron (1) , Peter Uhlig , Sylvain Pouliquen (5) , Arnaud Etcheberry (1)

1 ILV - Institut Lavoisier de Versailles
2 LPCNO - Laboratoire de physique et chimie des nano-objets
3 Air Liquide
4 IPVF - Institut Photovoltaïque d’Ile-de-France (UMR)
5 CRCD - Centre de Recherche Claude Delorme [Jouy-en-Josas]

Domaines: Chimie; Matériaux

Solène Béchu, Anais Loubat, Muriel Bouttemy, Yves Marot, Thomas Blévin, et al.. XPS profiling study of Al2O3 passivation layers for high efficiency n-PERT and PERC solar cells. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), Jun 2018, Waikoloa Village, France. IEEE, pp.3069-3072, ⟨10.1109/PVSC.2018.8547412⟩. ⟨hal-02393374⟩