Coupling GD-OES and XPS profiling to perform advanced physico-chemical characterizations of III-V layers for photovoltaic applications - Université Toulouse III - Paul Sabatier - Toulouse INP Accéder directement au contenu
Communication Dans Un Congrès Année : 2018

Coupling GD-OES and XPS profiling to perform advanced physico-chemical characterizations of III-V layers for photovoltaic applications

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Chimie Matériaux
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hal-02393376 , version 1 (04-12-2019)

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Anais Loubat, Solène Béchu, Muriel Bouttemy, Céline Eypert, Sofia Gaiaschi, et al.. Coupling GD-OES and XPS profiling to perform advanced physico-chemical characterizations of III-V layers for photovoltaic applications. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), Jun 2018, Waikoloa Village, France. pp.0066-0070, ⟨10.1109/PVSC.2018.8547731⟩. ⟨hal-02393376⟩
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