Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field

L. Bouhouch , A. Boyer (1, 2) , Sonia Ben Dhia (3) , Etienne Sicard (4) , M. Fadel (5)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 LAAS - Laboratoire d'analyse et d'architecture des systèmes
4 INSA Toulouse - Institut National des Sciences Appliquées - Toulouse
5 FSA - Faculté des Sciences Agadir

In this article the results of measurement in near-field concerning a 16-bit microcontroller from Freescale are reported, with and without a film of ferromagnetic material (Permalloy) plated against the surface of its package. This material improves near-field electromagnetic compatibility performances by reducing, in good proportion, the parasitic emission.

Domaines: Sciences de l'ingénieur [physics]; Electromagnétisme; Electronique

L. Bouhouch, A. Boyer, Sonia Ben Dhia, Etienne Sicard, M. Fadel. Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field. Ferroelectrics, 2008, 371 (1), pp.133-138. ⟨10.1080/00150190802397791⟩. ⟨hal-02523683⟩