On the measurement of crosstalk in integrated circuits

Sonia Ben Dhia (1) , Fabrice Caignet , E. Sicard (2)

1 LAAS - Laboratoire d'analyse et d'architecture des systèmes
2 INSA Toulouse - Institut National des Sciences Appliquées - Toulouse

This paper describes a specific technique for measuring and characterizing the time-domain aspect of the crosstalk effect based on a sampling technique. It includes the description of the circuit implementation in 0.7 /spl mu/m technology and the measurements of the crosstalk between metallization tracks within the chip, with a 10 ps resolution and 10 mV precision. A comparison between the measurements and analog simulations based on a distributed RC model is also included. The key advantages of this technique are that it is totally integrated, fully static, and adaptable to any CMOS technology.

Domaines: Sciences de l'ingénieur [physics]; Micro et nanotechnologies/Microélectronique

Sonia Ben Dhia, Fabrice Caignet, E. Sicard. On the measurement of crosstalk in integrated circuits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2000, 8 (5), pp.606-609. ⟨10.1109/92.894165⟩. ⟨hal-02523709⟩