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Chapitre D'ouvrage Année : 2012

Analysis of thin and thick Films

Philippe Le Coustumer
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Katrin Fuhrer
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Marc Gonin
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Markus Hohl
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Christian Tanner
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Lara Lobo Revilla
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Arnaud Littner
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Richard Vaux
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Julien Malherbe
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Frédéric Huneau
Hugues Francois-Saint-Cyr
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Résumé

Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.

This chapter contains sections titled:
Introduction
Thin and Thick Layers: A Tentative Definition
What Specific Information MS Techniques could Bring to thin and thick Films Analysis Compared to other Techniques?
Main MS Techniques Applied to Thin/Thick Films
Time of Sputtering/Speed of Acquisition Trade‐Off
Differences in Sputtering/Ionization Mechanisms between SIMS and GD‐MS
Pulse Shapes and how to Best Use Temporal Information for Pulsed Glow Discharge Mass Spectrometry
Measurement and Data Interpretation in GD‐TOFMS
Practical Examples
Conclusions
List of Abbreviations
References
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Dates et versions

hal-02540044 , version 1 (10-04-2020)

Identifiants

Citer

Philippe Le Coustumer, Patrick Chapon, Agnès Tempez, Yuriy Popov, George Thompson, et al.. Analysis of thin and thick Films. Mike S. Lee. Mass Spectrometry Handbook, John Wiley & Sons, Inc., pp.943-959, 2012, 9780470536735. ⟨10.1002/9781118180730.ch41⟩. ⟨hal-02540044⟩
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