Characterizing the dependence of vegetation model parameters on crop structure, incidence angle, and polarization at L-band - Université Toulouse III - Paul Sabatier - Toulouse INP Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Geoscience and Remote Sensing Année : 2004

Characterizing the dependence of vegetation model parameters on crop structure, incidence angle, and polarization at L-band

Résumé

To retrieve soil moisture over vegetation-covered areas from microwave radiometry, it is necessary to account for vegetation effects. At L-band, many retrieval approaches are based on a simple model that relies on two vegetation parameters: the optical depth (τ) and the single-scattering albedo (ω). When the retrievals are based on multiconfiguration measurements, it is necessary to take into account the dependence of τ and ω on the system configuration, in terms of incidence angle and polarization. In this paper, this dependence was investigated for several crop types (corn, soybean, wheat, grass, and alfalfa) based on L-band experimental datasets. The results should be useful for developing more accurate forward modeling and retrieval methods over mixed pixels including a variety of vegetation types.
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Dates et versions

hal-02678334 , version 1 (31-05-2020)

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Citer

Jean-Pierre Wigneron, Michael Pardé, Philippe Waldteufel, Andre Chanzy, Yann H. Kerr, et al.. Characterizing the dependence of vegetation model parameters on crop structure, incidence angle, and polarization at L-band. IEEE Transactions on Geoscience and Remote Sensing, 2004, 42 (2), pp.416-425. ⟨10.1109/TGRS.2003.817976⟩. ⟨hal-02678334⟩
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