Colorimetric Characterizations of Large Area White OLEDs Under Thermal And Electrical Stress Using TM-30-18 Method - Université Toulouse III - Paul Sabatier - Toulouse INP Accéder directement au contenu
Communication Dans Un Congrès Année : 2020

Colorimetric Characterizations of Large Area White OLEDs Under Thermal And Electrical Stress Using TM-30-18 Method

Fichier non déposé

Dates et versions

hal-02985405 , version 1 (02-11-2020)

Identifiants

Citer

Oussama Ben Abdellah, Andrea Al Haddad, Mustapha El Halaoui, Pascal Dupuis, Laurent Canale, et al.. Colorimetric Characterizations of Large Area White OLEDs Under Thermal And Electrical Stress Using TM-30-18 Method. 2020 Fifth Junior Conference on Lighting (Lighting), Sep 2020, Ruse, Bulgaria. pp.1-6, ⟨10.1109/Lighting47792.2020.9240586⟩. ⟨hal-02985405⟩
23 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More