Field and charge distribution at semicon/polyethylene interfaces from combinations of probe force microscopy measurements

Francesco Gullo (1) , T Christen (2) , Christina Villeneuve-Faure (3) , H Hillborg (4) , Christian Laurent (3) , Séverine Le Roy (3) , G. Teyssedre (3)

1 LAPLACE - LAboratoire PLasma et Conversion d'Energie
2 ABB
3 LAPLACE-DSF - Diélectriques Solides et Fiabilité
4 ABB Corporate Research [Västerås]

Two modes of Atomic Force Microscopy, namely the Peak Force-Quantitative Nano Mechanics and the Kelvin Probe Force Microscopy, are used for the nanoscale characterization of semicon(SC)-polyethylene(PE) interfaces in a SC-PE-SC-sandwich. A combination of the two methods provides physical (local geometry, roughness) and electrical (electric field, space charge) properties.

Mots clés: HVDC insulation; space charge; semicon-contact; AFM; HVDC insulation; KPFM; polyethylene

Domaines: Sciences de l'ingénieur [physics]

Francesco Gullo, T Christen, Christina Villeneuve-Faure, H Hillborg, Christian Laurent, et al.. Field and charge distribution at semicon/polyethylene interfaces from combinations of probe force microscopy measurements. 16th Int. Symp. on Electrets (ISE), Leuven, Belgium, 4-8 Sept. 2017, Sep 2017, Leuven, Belgium. p.29. ⟨hal-03032166⟩