Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)

Laurent Chusseau (1, 2) , Rachid Omarouayache (1) , Jérémy Raoult (1, 2) , Sylvie Jarrix (1, 2) , Philippe Maurine (3) , Karim Tobich (3) , Alexandre Boyer (4) , Bertrand Vrignon (5) , John Shepherd (5) , Thanh-Ha Le (6) , Maël Berthier (6) , Lionel Rivière (7) , Bruno Robisson (7) , Anne-Lise Ribotta (8)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 SysMIC - Conception et Test de Systèmes MICroélectroniques
4 LAAS - Laboratoire d'analyse et d'architecture des systèmes
5 Freescale Semiconductors, Toulouse
6 MORPHO (SAFRAN)
7 ERC CEA / EMSE - Équipe de Recherche Commune CEA - EMSE (SESAM : Secured Embedded Systems And Microelectronics)
8 CMP-ENSMSE - Centre Microélectronique de Provence - Site Georges Charpak (CMP-GC)

Electromagnetic fault injections are produced on secured ICs aiming to break crypto codes. We describe in this paper the whole chain of optimization necessary to achieve this goal, namely 1/ physical optimization of near-field probe and setup, 2/ signal management in timing, shape, and localization to induce the fault while beating countermeasures and 3/ understanding of fault propagation in logic to eventually protect future ICs.

Domaines: Micro et nanotechnologies/Microélectronique

Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, et al.. Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004189⟩. ⟨lirmm-01434592⟩