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hal-02005757
v1
Journal articles
M. Azib
,
F. Baudoin
,
Nicolas Binaud
,
C. Villeneuve-Faure
,
G. Teyssedre
et al.
Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud
Journal of Applied Physics
, American Institute of Physics, 2019, 125 (4), pp.045305.
⟨10.1063/1.5060655⟩
hal-02340262
v1
Conference papers
F. Gullo
,
T. Christen
,
C. Villeneuve-Faure
,
H. Hillborg
,
C. Laurent
et al.
Dependence of the Field and Charge Distribution at a Semicon/Polyethylene Interface on the Press-Molding Process Derived from Kelvin Probe Force Microscopy
2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
, Oct 2018, Cancun, Mexico. pp.469-472,
⟨10.1109/CEIDP.2018.8544910⟩
hal-02324432
v1
Conference papers
C. Villeneuve-Faure
,
G. Teyssedre
,
Séverine Le Roy
,
L. Boudou
,
K Makasheva
.
Interface properties in dielectrics: A cross-section analysis by atomic force microscopy
2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)
, May 2018, Xi'an, China. pp.1135-1138,
⟨10.1109/ICPADM.2018.8401246⟩
hal-01923822
v1
Journal articles
C. Villeneuve-Faure
,
D. Le Borgne
,
Kathleen Moineau-Chane Ching
,
Eléna Bedel-Pereira
,
D. Hernandez-Maldonado
et al.
Cross Kelvin force microscopy and conductive atomic force microscopy studies of organic bulk heterojunction blends for local morphology and electrical behavior analysis
Journal of Applied Physics
, American Institute of Physics, 2015, 117 (5), pp.055501/1-9.
⟨10.1063/1.4907213⟩
hal-01945628
v1
Journal articles
C. Villeneuve-Faure
,
D. Le Borgne
,
Vincent Ventalon
,
Isabelle Séguy
,
Kathleen Moineau-Chane Ching
et al.
Nanoscale investigations on interchain organization in thin films of polymer-liquid crystal blend
Journal of Chemical Physics
, American Institute of Physics, 2017, 147 (1), pp.014701.
⟨10.1063/1.4991415⟩
hal-02052281
v1
Conference papers
Vincent Ventalon
,
D. Le Borgne
,
D. Hernàndez-Maldonado
,
Kathleen Moineau-Chane Ching
,
C. Villeneuve-Faure
et al.
Correlation of structural organisation and electronic properties of P3HT: Ni-complexes thin films for organic bulk heterojunction solar cells
International Symposium on Functional Electron Systems (FPI 12)
, Jul 2015, SEATLE, United States
hal-00984302
v1
Journal articles
D. Hernandez-Maldonado
,
B. Ramos
,
C. Villeneuve-Faure
,
Eléna Bedel-Pereira
,
Isabelle Séguy
et al.
Chain ordering of regioregular polythiophene films through blending with a nickel bisdithiolene complex
Applied Physics Letters
, American Institute of Physics, 2014, 104 (10), pp.103302.
⟨10.1063/1.4868106⟩
hal-02324374
v1
Conference papers
C. Villeneuve-Faure
,
K Makasheva
,
L. Boudou
,
G. Teyssedre
.
Handling Geometric Features in Nanoscale Characterization of Charge Injection and Transport in thin Dielectric Films
2018 IEEE 2nd International Conference on Dielectrics (ICD)
, Jul 2018, Budapest, Hungary. pp.1-4,
⟨10.1109/ICD.2018.8468409⟩
hal-02324336
v1
Conference papers
C. Villeneuve-Faure
,
K Makasheva
,
C. Diaou
,
L. Boudou
,
G. Teyssedre
.
Characterization of the Electrical Behaviour of Thin Dielectric Films at Nanoscale using Methods Derived from Atomic Force Microscopy: Application to Plasma Deposited AgNPs-Based Nanocomposites
2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC)
, Oct 2018, Portland, United States. pp.1-4,
⟨10.1109/NMDC.2018.8605887⟩
hal-02324471
v1
Conference papers
F. Mortreuil
,
C. Villeneuve-Faure
,
L. Boudou
,
K Makasheva
,
G. Teyssedre
.
Charges injection investigation at metal/dielectric interfaces by Kelvin Probe Force Microscopy
2016 IEEE International Conference on Dielectrics (ICD)
, Jul 2016, Montpellier, France. pp.493-496,
⟨10.1109/ICD.2016.7547650⟩
hal-02324308
v1
Journal articles
C. Villeneuve-Faure
,
L. Boudou
,
K Makasheva
,
G. Teyssedre
.
Methodology for extraction of space charge density profiles at nanoscale from Kelvin probe force microscopy measurements
Nanotechnology
, Institute of Physics, 2017, 28 (50), pp.505701.
⟨10.1088/1361-6528/aa9839⟩
hal-02324315
v1
Journal articles
F Mortreuil
,
C. Villeneuve-Faure
,
L. Boudou
,
K Makasheva
,
G. Teyssedre
.
Charge injection phenomena at the metal/dielectric interface investigated by Kelvin probe force microscopy
Journal of Physics D: Applied Physics
, IOP Publishing, 2017, 50 (17), pp.175302.
⟨10.1088/1361-6463/aa665e⟩
hal-02005747
v1
Conference papers
M. Azib
,
F. Baudoin
,
C. Villeneuve-Faure
,
G. Teyssedre
,
Nicolas Binaud
et al.
Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D
2018 IEEE 2nd International Conference on Dielectrics (ICD)
, Jul 2018, Budapest, Hungary. pp.1-4,
⟨10.1109/ICD.2018.8514685⟩
hal-03033831
v1
Conference papers
M. Azib
,
F. Baudoin
,
Nicolas Binaud
,
Florian Bugarin
,
Stéphane Segonds
et al.
Inverse modelling for 3D Nano-localization of charges in thin dielectric
9ème Conférence Européenne sur les Méthodes Numériques en Electromagnétisme (NUMELEC), Paris, 15-17 Nov. 2017
, Nov 2017, Paris, France. pp. 1-2
hal-01988678
v1
Journal articles
A Scarangella
,
Marvine Soumbo
,
C. Villeneuve-Faure
,
Adnen Mlayah
,
Caroline Bonafos
et al.
Adsorption properties of BSA and DsRed proteins deposited on thin SiO2 layers: optically non-absorbing versus absorbing proteins
Nanotechnology
, Institute of Physics, 2018, 29 (11), pp.115101.
⟨10.1088/1361-6528/aaa68b⟩
hal-02940233
v1
Conference papers
Marvine Soumbo
,
A. Scarangella
,
C. Villeneuve-Faure
,
C. Bonafos
,
Christine Roques
et al.
Combined effect of proteins and AgNPs on the adhesion of yeast Candida albicans on solid silica surfaces
2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO)
, Jul 2020, Montreal, Canada. pp.242-245,
⟨10.1109/NANO47656.2020.9183494⟩
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