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hal-02005747v1  Conference papers
M. AzibF. BaudoinC. Villeneuve-FaureG. TeyssedreNicolas Binaud et al.  Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D
2018 IEEE 2nd International Conference on Dielectrics (ICD), Jul 2018, Budapest, France. pp.1-4
hal-02396103v1  Conference papers
M. HoangS. Le RoyG. TeyssedreL. Boudou. Inserting polarization processes in a fluid charge transport model: Improvements and difficulties
2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM), May 2018, Xi'an, France. pp.332-335, ⟨10.1109/ICPADM.2018.8401057⟩
hal-02396117v1  Conference papers
L. BoudouF. ZhengG. Teyssedre. Photo-stimulated discharge current measurements on biaxially oriented polypropylene thin films (BOPP)
2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM), May 2018, Xi'an, France. pp.722-725, ⟨10.1109/ICPADM.2018.8401125⟩
hal-02396181v1  Conference papers
M. AzibF. BaudoinC. Villeneuve-FaureG. TeyssedreN. Binaud et al.  Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D
2018 IEEE 2nd International Conference on Dielectrics (ICD), Jul 2018, Budapest, France. pp.1-4, ⟨10.1109/ICD.2018.8514685⟩
hal-02340318v1  Conference papers
G. TeyssedreC. LaurentL. BoudouSéverine Le Roy. High Electric Field and Energetic Processes in Poly(ethylene naphthalate)
2019 2nd International Conference on Electrical Materials and Power Equipment (ICEMPE), Apr 2019, Guangzhou, France. pp.85-90, ⟨10.1109/ICEMPE.2019.8727251⟩
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hal-02324432v1  Conference papers
C. Villeneuve-FaureG. TeyssedreS. Le RoyL. BoudouK. Makasheva. Interface properties in dielectrics: A cross-section analysis by atomic force microscopy
2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM), May 2018, Xi'an, China. pp.1135-1138, ⟨10.1109/ICPADM.2018.8401246⟩
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hal-02324440v1  Conference papers
K. MakashevaM. BelhajG. TeyssedreC. RigoudyS. Dadouch et al.  On the secondary electron emission phenomenon when originating from very thin layers
2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), Jul 2017, Pittsburgh, United States. pp.515-516, ⟨10.1109/NANO.2017.8117275⟩
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hal-02324471v1  Conference papers
F. MortreuilC. Villeneuve-FaureL. BoudouK. MakashevaG. Teyssedre. Charges injection investigation at metal/dielectric interfaces by Kelvin Probe Force Microscopy
2016 IEEE International Conference on Dielectrics (ICD), Jul 2016, Montpellier, France. pp.493-496, ⟨10.1109/ICD.2016.7547650⟩