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hal-00669726v1  Conference papers
Binhong LiNestor BerbelAlexandre BoyerSonia Ben DhiaRaul Fernandez-Garcia. Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences
European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2011), Oct 2011, Bordeaux, France. pp.1557
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hal-00669719v1  Conference papers
Nestor BerbelRaul Fernandez-GarciaIgnacio GilBinhong LiSonia Ben Dhia et al.  An alternative approach to model the Internal Activity of integrated circuits
8th Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.88
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hal-00937775v1  Journal articles
Alexandre BoyerSonia Ben DhiaBinhong LiNestor BerbelRaul Fernandez-Garcia. Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits
IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (1), pp. 44-50. ⟨10.1109/TEMC.2013.2272195⟩