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	hal-02324382v1 Conference papers C. Rigoudy, K Makasheva, G. Teyssedre, L. Boudou, M. Belhaj et al. Study of required conditions to limit the dielectric charging phenomenon when measuring the electron emission yield from thin dielectric layers 2018 IEEE 2nd International Conference on Dielectrics (ICD), Jul 2018, Budapest, Hungary. pp.1-4, ⟨10.1109/ICD.2018.8468360⟩
	hal-02324440v1 Conference papers K Makasheva, M. Belhaj, G. Teyssedre, C. Rigoudy, S. Dadouch et al. On the secondary electron emission phenomenon when originating from very thin layers 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), Jul 2017, Pittsburgh, United States. pp.515-516, ⟨10.1109/NANO.2017.8117275⟩
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