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hal-01343977v1  Conference papers
Jean-Guy TartarinSerge KarboyanFrançois OliviéGuilhem AstreLaurent Bary et al.  I-DLTS, Electrical Lag and Low Frequency Noise measurements of Trapping effects in AlGaN/GaN HEMT for reliability studies
European Microwave Integrated Circuits Conference (EuMIC 2011), Oct 2011, Manchester, United Kingdom. pp.438-441