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hal-03003165
v1
Conference papers
Charles Rigoudy
,
K Makasheva
,
Mohamed Belhaj
,
Sarah Dadouch
,
G. Teyssedre
et al.
Rational Engineering of the Dielectric Properties of Thin Silica Layers with a Single Plane of AgNPs
IEEE Internat. Conf. on Dielectrics (ICD), Valencia, Spain, 5-9 July 2020
, Jul 2020, Valencia, Spain. pp. 205-208
hal-02324484
v1
Conference papers
Laurent Milliere
,
G. Teyssedre
,
Christian Laurent
,
Bernard Despax
,
Laurent Boudou
et al.
Mitigation of charge injection in polyethylene films by silver nanoparticles/SiOxCy:H barrier layer: Dependence on the particles size and surface density
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP)
, Oct 2015, Ann Arbor, United States. pp.102-105,
⟨10.1109/CEIDP.2015.7352009⟩
hal-02448489
v1
Journal articles
Laurent Milliere
,
K Makasheva
,
Carine Laurent
,
Bernard Despax
,
Laurent Boudou
et al.
Silver nanoparticles as a key feature of a plasma polymer composite layer in mitigation of charge injection into polyethylene under dc stress
Journal of Physics D: Applied Physics
, IOP Publishing, 2016, 49 (1), pp.015304.
⟨10.1088/0022-3727/49/1/015304⟩
hal-02448419
v1
Journal articles
Christina Villeneuve-Faure
,
K Makasheva
,
Laurent Boudou
,
G. Teyssedre
.
Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process
Nanotechnology
, Institute of Physics, 2016, 27 (24), pp.245702.
⟨10.1088/0957-4484/27/24/245702⟩
hal-02448461
v1
Journal articles
Christina Villeneuve-Faure
,
Laurent Boudou
,
K Makasheva
,
G. Teyssedre
.
Atomic force microscopy developments for probing space charge at sub-micrometer scale in thin dielectric films
IEEE Transactions on Dielectrics and Electrical Insulation
, Institute of Electrical and Electronics Engineers, 2016, 23 (2), pp.713-720.
⟨10.1109/TDEI.2016.005319⟩
hal-01053188
v1
Conference papers
G. Teyssedre
,
Christina Villeneuve
,
Patrick Pons
,
Laurent Boudou
,
K Makasheva
et al.
Challenges in probing space charge at sub-micrometer scale
Electrical Insulation and Dielectric Phenomena (CEIDP)
, Oct 2012, Montreal, Canada. 5 p
hal-01763535
v1
Conference papers
K Makasheva
,
Christina Villeneuve-Faure
,
Caroline Bonafos
,
Christian Laurent
,
Alessandro Pugliara
et al.
Dielectric engineering of nanostructured layers preventing electrostatic charging in thin dielectrics
Nanotechnology Materials and Devices Conference (NMDC), 2015 IEEE
, Sep 2015, Anchorage, United States.
⟨10.1109/NMDC.2015.7439236⟩
hal-00670156
v1
Conference papers
K Makasheva
,
Bernard Despax
,
Laurent Boudou
,
G. Teyssedre
,
L. Ressier
et al.
Dielectric layers with gradual properties
IEEE International Conference on Solid Dielectrics
, Jul 2010, Potsdam, Germany. 4 p
hal-00878200
v1
Journal articles
Christina Villeneuve
,
K Makasheva
,
Caroline Bonafos
,
B. Despax
,
Laurent Boudou
et al.
Kelvin force microscopy characterization of charging effect in thin a-SiOxNy:H layers deposited in pulsed plasma enhanced chemical vapordeposition process by tuning the Silicon-environment
Journal of Applied Physics
, American Institute of Physics, 2013, 113 (20), pp.204102
hal-02324281
v1
Book sections
Christina Villeneuve-Faure
,
K Makasheva
,
Laurent Boudou
,
G. Teyssedre
.
Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM
Celano U.
Electrical Atomic Force Microscopy for Nanoelectronics
, Springer, pp.267-301, 2019, NanoScience and Technology,
⟨10.1007/978-3-030-15612-1_9⟩
hal-02974746
v1
Journal articles
Florian Mortreuil
,
Laurent Boudou
,
K Makasheva
,
G. Teyssedre
,
Christina Villeneuve-Faure
.
Influence of dielectric layer thickness on charge injection, accumulation and transport phenomena in thin silicon oxynitride layers: a nanoscale study
Nanotechnology
, Institute of Physics, 2021, 32 (6), pp.065706.
⟨10.1088/1361-6528/abc38a⟩
hal-02448512
v1
Journal articles
K Makasheva
,
Christina Villeneuve-Faure
,
Christian Laurent
,
Bernard Despax
,
Laurent Boudou
et al.
Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms
Nanotechnology
, Institute of Physics, 2015, 26 (29), pp.295704.
⟨10.1088/0957-4484/26/29/295704⟩
hal-02397415
v1
Conference papers
C. Djaou
,
Christina Villeneuve-Faure
,
Laurent Boudou
,
K Makasheva
,
G. Teyssedre
.
Etude par Microscopie à sonde de Kelvin (KPFM) des phénomènes d’injection et de stockage de charges électriques dans des couches minces de SiO2 contenant des inclusions métalliques de taille nanométrique
11e Conf. Société Française d'Electrostatique (SFE), 29-31 août 2018, Grenoble, France. Proc. SFE 2018, pp. 1-5, 2018
, Aug 2018, Grenoble, France. pp.1-5
hal-01763540
v1
Journal articles
K Makasheva
,
Christina Villeneuve-Faure
,
Caroline Bonafos
,
Christian Laurent
,
Alessandro Pugliara
et al.
Dielectric Engineering of Nanostructured Layers to Control the Transport of Injected Charges in Thin Dielectrics
IEEE Transactions on Nanotechnology
, Institute of Electrical and Electronics Engineers, 2016, 15 (6), pp.839-848.
⟨10.1109/TNANO.2016.2553179⟩
hal-02324467
v1
Conference papers
K Makasheva
,
Bernard Despax
,
Christian Laurent
,
Laurent Milliere
,
Christina Villeneuve-Faure
et al.
Plasma based concept for engineering of multifunctional materials with application to synthesis of large-area plasmonic substrates and to control the charge injection in dielectrics
2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO)
, Aug 2016, Sendai, Japan. pp.8-11,
⟨10.1109/NANO.2016.7751389⟩
hal-03034154
v1
Conference papers
Christina Villeneuve-Faure
,
Abderrahmane Boularas
,
Laurent Boudou
,
K Makasheva
,
G. Teyssedre
.
Utilisation des courbes de force pour l'étude à l'échelle nanométrique des charges piégées dans les diélectriques en couches minces
18e Forum des microscopies à sonde locale, Forêt d'Orient, 16-20 Mars 2015
, Mar 2015, Forêt d'Orient, France. pp. 109-110
hal-03032206
v1
Conference papers
Christina Villeneuve
,
Florian Mortreuil
,
Laurent Boudou
,
K Makasheva
,
G. Teyssedre
.
Méthodologie pour la mesure de charges d'espace par microscopie à sonde de Kelvin (KPFM)
19e Forum des microscopies à sonde locale, Sochaux, 21-25 Mars 2016
, Mar 2016, Sochaux, France. p.72
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