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hal-02340262v1
Conference papers
Dependence of the Field and Charge Distribution at a Semicon/Polyethylene Interface on the Press-Molding Process Derived from Kelvin Probe Force Microscopy 2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Oct 2018, Cancun, Mexico. pp.469-472, ⟨10.1109/CEIDP.2018.8544910⟩ |
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