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hal-01225352v1
Conference papers
Analysis and Modelling of Passive device degradation for a long-term electromagnetic emission study of a DC-DC converter 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France |
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hal-02616898v1
Journal articles
Timing of Renal Support and Outcome of Septic Shock and Acute Respiratory Distress Syndrome. A Post Hoc Analysis of the AKIKI Randomized Clinical Trial American Journal of Respiratory and Critical Care Medicine, 2018, 198 (1), pp.58-66. ⟨10.1164/rccm.201706-1255OC⟩ |
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hal-01225370v1
Conference papers
EMC modeling of Integrated Circuits using IC-EMC 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 2p |
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hal-00709287v1
Journal articles
Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors Electronics Letters, IET, 2012, 48 (11), pp.649-650. ⟨10.1049/el.2012.0407⟩ |
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hal-00669745v1
Journal articles
Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests Electronics Letters, IET, 2010, 46 (4), p. 278-280. ⟨10.1049/el.2010.2885⟩ |
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lirmm-01434592v1
Conference papers
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI) VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004189⟩ |
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hal-01068132v1
Conference papers
IMPACT DU VIEILLISSEMENT THERMIQUE SUR L'EMISSION D'UN CONVERTISSEUR BUCK 17ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2014), Jul 2014, Clermont-Ferrand, France. pp.1-5 |
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hal-01225367v1
Conference papers
Developing a Universal Exchange Format for Integrated Circuit Emission Model – Conducted Emissions 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p |
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hal-02319457v1
Conference papers
New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs 29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨10.1016/j.microrel.2018.07.090⟩ |
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hal-00945301v1
Conference papers
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission 2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.190-195, ⟨10.1109/EMCCompo.2013.6735199⟩ |
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hal-00669716v1
Conference papers
Construction and Evaluation of the Susceptibility Model of an Integrated Phase-Locked Loop 8th Workshop on Electromagnetic Compatibility of Itnegrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.7 |
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hal-01017384v1
Conference papers
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing Test Workshop - LATW, 2014 15th Latin American, Mar 2014, Fortaleza, Brazil. pp.1-6 |
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hal-01574389v1
Conference papers
Radiated suceptibility investigation of electronic board from near field scan method 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.125-130, ⟨10.1109/EMCCompo.2017.7998096⟩ |
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hal-01225377v1
Conference papers
ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom |
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hal-01225350v1
Conference papers
Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter EMC Europe 2015, Aug 2015, Dresden, Germany. 6p |
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hal-01225358v1
Conference papers
Bandgap Failure Study Due To Parasitic Bipolar Substrate Coupling In Smart Power Mixed ICs 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 5p |
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hal-00669533v1
Conference papers
An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences 8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Nov 2011, Dubrovnik, Croatia. pp.251 |
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hal-00668627v1
Journal articles
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, 61 (3), pp.696. ⟨10.1109/TIM.2011.2172116⟩ |
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hal-01951651v1
Books
Basis of Electromagnetic Compatibility of Integrated Circuits - A modeling approach using IC-EMC Presses Universitaires du Midi - Collection Pour l'ingénieur. Presses universitaires du Midi (PUM), 390p., 2017, 978-2-8107-0522-1 |
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hal-01225364v1
Conference papers
EMC performance analysis of a Processor/Memory System using PCB and Package-On-Package 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p |
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hal-01225338v1
Journal articles
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.2050-2054. ⟨10.1016/j.microrel.2015.07.008⟩ |
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hal-01885517v1
Journal articles
New defect detection approach using near electromagnetic field probing of high density PCBAs Microelectronics Reliability, Elsevier, 2018, 88-90, pp.288-293. ⟨10.1016/j.microrel.2018.07.090⟩ |
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hal-00669515v1
Journal articles
Ageing effect on electromagnetic susceptibility of a phase locked loop Microelectronics Reliability, Elsevier, 2010, 50 (9), p.1304-1308. ⟨10.1016/j.microrel.2010.07.100⟩ |
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hal-01225333v1
Journal articles
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp. 2061-2066. ⟨10.1016/j.microrel.2015.06.058⟩ |
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hal-01892684v1
Conference papers
Electromagnetic near field injection model on integrated circuit Progress In Electromagnetics Research Symposium (PIERS 2015), Jul 2015, Prague, Czech Republic |
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hal-01892688v1
Conference papers
Modèle d'injection électromagnétique en champ proche sur circuit intégré 19èmes Journées Nationales Microondes - JNM 2015, Jun 2015, Bordeaux, France |
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hal-01159232v1
Journal articles
Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (3), pp.726-735. ⟨10.1109/TEMC.2013.2294951⟩ |
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hal-00937780v1
Journal articles
Characterization of Changes in LDO Susceptibility after Electrical Stress IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (5), pp.883-890. ⟨10.1109/TEMC.2013.2242471⟩ |
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hal-02523680v1
Journal articles
The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩ |
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hal-00669519v1
Journal articles
Characterization of the Evolution of IC Emissions after Accelerated Aging IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2009, 51 (4), pp.892. ⟨10.1109⟩ |
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