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	hal-01225352v1 Conference papers He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and Modelling of Passive device degradation for a long-term electromagnetic emission study of a DC-DC converter 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France
	hal-02616898v1 Journal articles Stéphane Gaudry, David Hajage, Frederique Schortgen, Laurent Martin-Lefevre, Charles Verney et al. Timing of Renal Support and Outcome of Septic Shock and Acute Respiratory Distress Syndrome. A Post Hoc Analysis of the AKIKI Randomized Clinical Trial American Journal of Respiratory and Critical Care Medicine, 2018, 198 (1), pp.58-66. ⟨10.1164/rccm.201706-1255OC⟩
	hal-01225370v1 Conference papers Etienne Sicard, Alexandre Boyer. EMC modeling of Integrated Circuits using IC-EMC 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 2p
	hal-00709287v1 Journal articles Jian-Fei Wu, Etienne Sicard, Alexandre Boyer, Sonia Ben Dhia, Jiancheng Li et al. Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors Electronics Letters, IET, 2012, 48 (11), pp.649-650. ⟨10.1049/el.2012.0407⟩
	hal-00669745v1 Journal articles Sonia Ben Dhia, Alexandre Boyer, Binhong Li, Amadou Ndoye Cisse. Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests Electronics Letters, IET, 2010, 46 (4), p. 278-280. ⟨10.1049/el.2010.2885⟩
	lirmm-01434592v1 Conference papers Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine et al. Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI) VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004189⟩
	hal-01068132v1 Conference papers He Huang, Alexandre Boyer, Sonia Ben Dhia. IMPACT DU VIEILLISSEMENT THERMIQUE SUR L'EMISSION D'UN CONVERTISSEUR BUCK 17ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2014), Jul 2014, Clermont-Ferrand, France. pp.1-5
	hal-01225367v1 Conference papers Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot et al. Developing a Universal Exchange Format for Integrated Circuit Emission Model – Conducted Emissions 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p
	hal-02319457v1 Conference papers Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs 29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨10.1016/j.microrel.2018.07.090⟩
	hal-00945301v1 Conference papers Alexandre Boyer, Sonia Ben Dhia. Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission 2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.190-195, ⟨10.1109/EMCCompo.2013.6735199⟩
	hal-00669716v1 Conference papers Alexandre Boyer, Sonia Ben Dhia, Christophe Lemoine, Bertrand Vrignon. Construction and Evaluation of the Susceptibility Model of an Integrated Phase-Locked Loop 8th Workshop on Electromagnetic Compatibility of Itnegrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.7
	hal-01017384v1 Conference papers Sonia Ben Dhia, Alexandre Boyer. Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing Test Workshop - LATW, 2014 15th Latin American, Mar 2014, Fortaleza, Brazil. pp.1-6
	hal-01574389v1 Conference papers Nicolas Lacrampe, Sebastien Serpaud, Alexandre Boyer, Séreirath Tran. Radiated suceptibility investigation of electronic board from near field scan method 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.125-130, ⟨10.1109/EMCCompo.2017.7998096⟩
	hal-01225377v1 Conference papers Alexandre Boyer, He Huang, Sonia Ben Dhia. ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom
	hal-01225350v1 Conference papers He Huang, Alexandre Boyer, Sonia Ben Dhia. Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter EMC Europe 2015, Aug 2015, Dresden, Germany. 6p
	hal-01225358v1 Conference papers Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia. Bandgap Failure Study Due To Parasitic Bipolar Substrate Coupling In Smart Power Mixed ICs 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 5p
	hal-00669533v1 Conference papers Alexandre Boyer, Sonia Ben Dhia, Christophe Lemoine, Bertrand Vrignon. An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences 8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Nov 2011, Dubrovnik, Croatia. pp.251
	hal-00668627v1 Journal articles Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikael Deobarro, Dinh Than Vinh. On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, 61 (3), pp.696. ⟨10.1109/TIM.2011.2172116⟩
	hal-01951651v1 Books Alexandre Boyer, Etienne Sicard. Basis of Electromagnetic Compatibility of Integrated Circuits - A modeling approach using IC-EMC Presses Universitaires du Midi - Collection Pour l'ingénieur. Presses universitaires du Midi (PUM), 390p., 2017, 978-2-8107-0522-1
	hal-01225364v1 Conference papers Etienne Sicard, Alexandre Boyer, Priscillia Fernandez-Lopez, An Zhou, Nicolas Marier et al. EMC performance analysis of a Processor/Memory System using PCB and Package-On-Package 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p
	hal-01225338v1 Journal articles He Huang, Alexandre Boyer, Sonia Ben Dhia. Electronic counterfeit detection based on the measurement of electromagnetic fingerprint Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.2050-2054. ⟨10.1016/j.microrel.2015.07.008⟩
	hal-01885517v1 Journal articles Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, A. Viard. New defect detection approach using near electromagnetic field probing of high density PCBAs Microelectronics Reliability, Elsevier, 2018, 88-90, pp.288-293. ⟨10.1016/j.microrel.2018.07.090⟩
	hal-00669515v1 Journal articles Binhong Li, Alexandre Boyer, Sonia Ben Dhia, Christophe Lemoine. Ageing effect on electromagnetic susceptibility of a phase locked loop Microelectronics Reliability, Elsevier, 2010, 50 (9), p.1304-1308. ⟨10.1016/j.microrel.2010.07.100⟩
	hal-01225333v1 Journal articles He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp. 2061-2066. ⟨10.1016/j.microrel.2015.06.058⟩
	hal-01892684v1 Conference papers Rachid Omarouayache, Jérémy Raoult, Pierre Payet, Laurent Chusseau, Bertrand Vrignon et al. Electromagnetic near field injection model on integrated circuit Progress In Electromagnetics Research Symposium (PIERS 2015), Jul 2015, Prague, Czech Republic
	hal-01892688v1 Conference papers Rachid Omarouayache, Jérémy Raoult, Pierre Payet, Laurent Chusseau, Bertrand Vrignon et al. Modèle d'injection électromagnétique en champ proche sur circuit intégré 19èmes Journées Nationales Microondes - JNM 2015, Jun 2015, Bordeaux, France
	hal-01159232v1 Journal articles Jianfei Wu, Alexandre Boyer, Jiancheng Li, Bertrand Vrignon, Etienne Sicard et al. Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (3), pp.726-735. ⟨10.1109/TEMC.2013.2294951⟩
	hal-00937780v1 Journal articles Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Ben Dhia, Rongjun Shen. Characterization of Changes in LDO Susceptibility after Electrical Stress IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (5), pp.883-890. ⟨10.1109/TEMC.2013.2242471⟩
	hal-02523680v1 Journal articles Mohamed Ramdani, Etienne Sicard, Alexandre Boyer, Sonia Ben Dhia, James Whalen et al. The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩
	hal-00669519v1 Journal articles Alexandre Boyer, Amadou Ndoye Cisse, Sonia Ben Dhia, Laurent Guillot, Bertrand Vrignon. Characterization of the Evolution of IC Emissions after Accelerated Aging IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2009, 51 (4), pp.892. ⟨10.1109⟩
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