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hal-01343434v1  Conference papers
Jean-Guy TartarinGeoffroy Soubercaze-PunAbdelali RennaneLaurent BaryS Delage et al.  Low Frequency Noise Of AlGaN/GaN HEMT Grown On Al2O3 , Si And SiC Substrates
18th International Conference on Noise and Fluctuations (ICNF 2005), Sep 2005, Salamanque, Spain. ⟨10.1063/1.2036754⟩
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hal-01343955v1  Conference papers
Rémi CorbièreBruno LouisJean-Guy Tartarin. A novel active variable gain X-Band amplifier in SiGe technology
International Microwave Symposium (IMS 2010), May 2010, Anaheim, CA, United States. pp.312-315, ⟨10.1109/MWSYM.2010.5515104⟩
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hal-01343356v1  Conference papers
Geoffroy Soubercaze-PunJean-Guy TartarinLaurent BaryS DelageRobert Plana et al.  Carrier's transport mechanisms investigations in AlGaN/GaN HEMT thanks to physical modelling and low frequency noise measurements
12th Gallium Arsenide and other Compound Semiconductors Application Symposium (GAAS 2004), Oct 2004, Amsterdam, Netherlands. pp.161-162
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hal-00859789v1  Conference papers
Séraphin Dieudonné NseleLaurent EscotteJean-Guy TartarinStéphane Piotrowicz. Noise characteristics of AlInN/GaN HEMTs at microwave frequencies
International Conference on Noise and Fluctuations, Jun 2013, Montpellier, France. pp.10.1109/ICNF.2013.6578989
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hal-02315085v1  Conference papers
Jacques GraffeuilLaurent EscotteJean-Guy Tartarin. Low Frequency Noise Deviation from Schottky theory in p-n junctions
IEEE International Conference on Noise and Fluctuation (ICNF 2019), Jun 2019, Neuchatel, Switzerland. https://icnf2019.epfl.ch/wp-content/uploads/2019/10/ICNF2019_Proceedings.pdf
hal-02088233v1  Conference papers
Jean-Guy Tartarin. GaN Technologies: From The Improvement Of Device Reliability To The Design Of Robust High Frequency Circuits
World Congress of Advanced Materials (WCAM 2016 5th BIT congress), Jun 2016, Chongqing, China
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hal-02315126v1  Conference papers
Boris BerthelotJean-Guy TartarinChristophe ViallonRemy LeblancHassan Maher et al.  GaN MMIC Differential Multi-function Chip for Ka-Band Applications
2019 IEEE/MTT-S International Microwave Symposium - IMS 2019, Jun 2019, Boston, United States. pp.1399-1402, ⟨10.1109/MWSYM.2019.8701085⟩
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hal-02086969v1  Journal articles
Jean-Guy TartarinDamien SaugnonLaurent BaryJacques Graffeuil. Secured Failure Analysis Methodology for Accurate Diagnostic of Defects in GaN HEMT Technologies
International Journal of Information Science and technology, 2019, 3 (1), pp.3-12
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tel-00539034v1  Habilitation à diriger des recherches
Jean-Guy Tartarin. LE BRUIT DE FOND ÉLECTRIQUE DANS LES COMPOSANTS ACTIFS, CIRCUITS ET SYSTÈMES DES HAUTES FRÉQUENCES : DES CAUSES VERS LES EFFETS
Sciences de l'ingénieur [physics]. Université Paul Sabatier - Toulouse III, 2009
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hal-00907447v1  Conference papers
Jean-Guy Tartarin. Diagnostic Tools For Accurate Reliability Investigations of GaN Devices
21st International Conference on Noise and Fluctuations (ICNF 2011) by Institute of Electrical and Electronics Engineers ( IEEE ), Jun 2011, Toronto, Canada
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hal-01343322v1  Conference papers
Jean-Guy TartarinGuilhem AstreLaurent BaryJacques ChevallierS Delage°. Improved robustness of AlGaN/GaN HEMTs using Deuterium to passivate the structural defects
Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2008), Jul 2008, Sydney, Australia. ⟨10.1109/COMMAD.2008.4802078⟩
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hal-01343429v1  Conference papers
Serge KarboyanJean-Guy TartarinN LabatB. Lambert. Gate and drain low frequency noise of ALGaN/GaN HEMTs featuring high and low gate leakage currents
22nd International Conference on Noise and Fluctuations (ICNF 2013), Jun 2013, Montpellier, France. ⟨10.1109/ICNF.2013.6578954⟩
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hal-01343284v1  Conference papers
Geoffroy Soubercaze-PunJean-Guy TartarinLaurent BaryJacques RayssacS Delage et al.  ROBUST GAN ELECTRONICS FOR HIGHLY RELIABLE BF AND RF ANALOG SYSTEMS IN AEROSPACE APPLICATIONS
Micro-Nano-Technologies for Space Application (CANEUS 2006), Aug 2006, Toulouse, France. pp.81-87, ⟨10.1115/CANEUS2006-11012⟩
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hal-01343350v1  Conference papers
Mohammed CheikhJacques David°Jean-Guy TartarinSébastien KesslerAlexis Morin. RF Source Characterization Of Tire Pressure Monitoring System
European Wireless Technology Conference (EuWIT 2009), Sep 2009, Rome, Italy. pp.176-179
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hal-01343426v1  Conference papers
Jean-Guy TartarinSerge KarboyanD CarisettiB. Lambert. Gate defects in AlGaN/GaN HEMTs revealed by low frequency noise measurements
22nd International Conference on Noise and Fluctuations (ICNF 2013), Jun 2013, Montpellier, France. ⟨10.1109/ICNF.2013.6578987⟩
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hal-01343436v1  Conference papers
Mohammed CheikhJean-Guy TartarinJacques DavidSébastien KesslerAlexis Morin. Transmission quality evaluation of Tire Pressure Monitoring Systems
ITSC 2009 12th International IEEE Conference on Intelligent Transportation Systems, Oct 2009, Saint-Louis, United States. 5p., ⟨10.1109/ITSC.2009.5309712⟩
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hal-01343966v1  Conference papers
Oana LazarJean-Guy TartarinB LambertC MoreauJ.L. Roux et al.  New approach for an accurate Schottky Barrier Height's extraction by I-V-T measurements
International Microwave Symposium (IMS 2015), May 2015, Phoenix, AZ, United States. pp.1-4, ⟨10.1109/MWSYM.2015.7166789⟩