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hal-01843388v1  Conference papers
Bertrand CourivaudNicolas NolhierG. FerruMarise BafleurFabrice Caignet. Novel 3D back-to-back diodes ESD protection
Electrical Overstress/Electrostatic Discharge (EOS/ESD) Symposium , Sep 2014, Tucson, AZ, United States. 4p
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hal-01843394v1  Conference papers
Bertrand CourivaudNicolas NolhierG. FerruMarise BafleurFabrice Caignet. Novel 3D back-to-back diodes ESD protection
International ESD Workshop (IEW) , May 2014, Villard de Lans, France. 2p
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hal-00945046v1  Conference papers
Romain MonthéardS. CarbonneMarise BafleurVincent BoitierJean-Marie Dilhac et al.  Proof of concept of energy harvesting from aero acoustic noise
12th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2012), Dec 2012, Atlanta, United States. pp. 267-270
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hal-01980187v1  Book sections
Marise BafleurFabrice CaignetNicolas Nolhier. Voiture autonome : le défi du zéro défaut pour la fiabilité des systèmes électroniques embarqués
Transports du futur: Regards croisés de chercheur.e.s, pp.20, 2018, Collection Petit illustré
hal-01257945v1  Directions of work or proceedings
Philippe PerduFrançois MarcMarise BafleurHélène FrémontNicolas Nolhier. Microelectronics Reliability Volume 55, Issues 9–10
France. Volume 55, ( Issues 9–10), 2015, Microelectronics Reliability
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hal-00445676v1  Conference papers
Antoine DelmasNicolas NolhierDavid TrémouillesMarise BafleurNicolas Mauran et al.  Accurate Transient Behavior Measurement of High- Voltage ESD Protections Based on a Very Fast Transmission-Line Pulse System
31st Electrical Overstress/Electrostatic Discharge Symposium, 2009. EOS/ESD Symposium, Aug 2009, ANAHEIM, United States. pp.165-172
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hal-01698411v1  Conference papers
Fabien EscudiéFabrice CaignetNicolas Nolhier. Modélisation de système pour la prédiction de défaillances dues aux décharges électrostatiques
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2016), May 2016, Toulouse, France. 5p
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hal-01698420v1  Conference papers
Fabien EscudiéFabrice CaignetNicolas NolhierMarise Bafleur. Présentation d'un travail normatif de modélisation de système pour la prédiction de défaillance ESD
18 ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2016) , Jul 2016, Rennes, France. 6p
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hal-01698505v1  Conference papers
Fabien EscudiéFabrice CaignetNicolas Nolhier. LIN communication behaviours against ESD events
2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/EMCEurope.2017.8094675⟩
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hal-00383352v1  Conference papers
David TrémouillesGéraldine BertrandMarise BafleurNicolas NolhierLionel Lescouzères. Design Guidelines to Achieve a Very High ESD Robustness in a Self-Biased NPN
Electrical Overstress and Electrostatic Discharge Symposium, Oct 2002, Charlotte, United States. pp.281-288
hal-00401483v1  Conference papers
Nicolas GuitardFabien EsselyDavid TrémouillesMarise BafleurNicolas Nolhier et al.  Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), 2005, arcachon, France. pp.1415-1420
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hal-00668827v1  Journal articles
Jinyu Jason RuanNicolas MonnereauDavid TrémouillesNicolas MauranFabio Coccetti et al.  An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, pp.456-461. ⟨10.1109/TIM.2011.2161937⟩
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hal-00998857v1  Journal articles
Jean-Marie DilhacRomain MonthéardMarise BafleurVincent BoitierNicolas Nolhier et al.  Implementation of Thermoelectric Generators in Airliners for Powering,Battery-free Wireless Sensor Networks
Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2014, 43 (6), pp.2444-2451
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hal-01239444v1  Conference papers
Fabrice CaignetNicolas NolhierMarise Bafleur. Dynamic system level ESD current measurement using magnetic field probe
Asia-Pacific International Symposium on Electromagnetic Compatibility ( APEMC ), May 2015, Taipei, Taiwan. ⟨10.1109/APEMC.2015.7175400⟩
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hal-01239451v1  Conference papers
Rémi BègesFabrice CaignetPatrice BesseJean-Philippe LaineAlain Salles et al.  TLP-based Human Metal Model stress generator and analysis method of ESD generators
Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. ⟨10.1109/EOSESD.2015.7314777⟩
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hal-00195362v1  Conference papers
Philippe RenaudAmaury GendronMarise BafleurNicolas Nolhier. High robustness PNP-based structure for the ESD protection of high voltage I/Os in an advanced smart power technology
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2007, BOSTON, United States. pp.359
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hal-01218702v1  Journal articles
Bertrand CourivaudNicolas NolhierG FerruMarise BafleurFabrice Caignet. Reliability of ESD protection devices designed in a 3D technology
Microelectronics Reliability, Elsevier, 2014, Microelectronics Reliability, 54 (9), pp.2272-2277. ⟨10.1016/j.microrel.2014.07.136⟩
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hal-00722641v1  Conference papers
Antoine DelmasAmaury GendronMarise BafleurNicolas NolhierChai Gill. Transient Voltage Overshoots of High Voltage ESD Protections Based on Bipolar Transistors in Smart Power Technology
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2010, AUSTIN, United States. pp.253-256
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hal-00722644v1  Conference papers
Fabrice CaignetNicolas MonnereauNicolas NolhierMarise Bafleur. Behavioral ESD Protection Modeling to perform System Level ESD Efficient Design
Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), May 2012, SINGAPORE, Singapore. pp.401-404