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hal-01843388v1
Conference papers
Novel 3D back-to-back diodes ESD protection Electrical Overstress/Electrostatic Discharge (EOS/ESD) Symposium , Sep 2014, Tucson, AZ, United States. 4p |
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hal-01843394v1
Conference papers
Novel 3D back-to-back diodes ESD protection International ESD Workshop (IEW) , May 2014, Villard de Lans, France. 2p |
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hal-00945046v1
Conference papers
Proof of concept of energy harvesting from aero acoustic noise 12th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2012), Dec 2012, Atlanta, United States. pp. 267-270 |
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hal-01980187v1
Book sections
Voiture autonome : le défi du zéro défaut pour la fiabilité des systèmes électroniques embarqués Transports du futur: Regards croisés de chercheur.e.s, pp.20, 2018, Collection Petit illustré |
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hal-01702094v1
Books
Méthodologies de protection ESD : du composant au système ISTE Editions. 280p., 2018, 9781784053260 |
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hal-01613901v1
Books
ESD Protection Methodologies: From Component to System Elsevier, 284p., 2017, 978-1-78548-122-2 |
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hal-01497529v1
Journal articles
Coupling Supercapacitors and Aeroacoustic Energy Harvesting for Autonomous Wireless Sensing in Aeronautics Applications Energy Harvesting and Systems, DE GRUYTER, 2016, 3 (4), pp.265-276. ⟨10.1515/ehs-2016-0003⟩ |
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hal-01218627v1
Book sections
Protecting Mixed-Signal Technologies Against Electrostatic Discharges: Challenges and Protection Strategies from Component to System Thomas NOULIS. Mixed-signal circuits, CRC PRESS, 40p. Chapter 3, 2015, Devices, Circuits, and Systems Series, 9781482260625 |
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hal-01257945v1
Directions of work or proceedings
Microelectronics Reliability Volume 55, Issues 9–10 France. Volume 55, ( Issues 9–10), 2015, Microelectronics Reliability |
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hal-00445676v1
Conference papers
Accurate Transient Behavior Measurement of High- Voltage ESD Protections Based on a Very Fast Transmission-Line Pulse System 31st Electrical Overstress/Electrostatic Discharge Symposium, 2009. EOS/ESD Symposium, Aug 2009, ANAHEIM, United States. pp.165-172 |
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hal-00382960v1
Journal articles
Analytical description of the injection ratio of self-biased bipolar transistors under the very high injection conditions of ESD events Solid-State Electronics, Elsevier, 2007, 52 (5), pp.663-674 |
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hal-01698411v1
Conference papers
Modélisation de système pour la prédiction de défaillances dues aux décharges électrostatiques Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2016), May 2016, Toulouse, France. 5p |
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hal-01698420v1
Conference papers
Présentation d'un travail normatif de modélisation de système pour la prédiction de défaillance ESD 18 ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2016) , Jul 2016, Rennes, France. 6p |
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hal-01698505v1
Conference papers
LIN communication behaviours against ESD events 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/EMCEurope.2017.8094675⟩ |
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hal-00383352v1
Conference papers
Design Guidelines to Achieve a Very High ESD Robustness in a Self-Biased NPN Electrical Overstress and Electrostatic Discharge Symposium, Oct 2002, Charlotte, United States. pp.281-288 |
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hal-00401483v1
Conference papers
Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), 2005, arcachon, France. pp.1415-1420 |
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hal-01056511v1
Conference papers
Transient-TLP (T-TLP): a simple method for accurate ESD protection transient behavior measurement EOS/ESD Symposium, Sep 2013, LAS VEGAS, United States. pp.258-267 |
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hal-00668827v1
Journal articles
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, pp.456-461. ⟨10.1109/TIM.2011.2161937⟩ |
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hal-00998857v1
Journal articles
Implementation of Thermoelectric Generators in Airliners for Powering,Battery-free Wireless Sensor Networks Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2014, 43 (6), pp.2444-2451 |
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hal-01239444v1
Conference papers
Dynamic system level ESD current measurement using magnetic field probe Asia-Pacific International Symposium on Electromagnetic Compatibility ( APEMC ), May 2015, Taipei, Taiwan. ⟨10.1109/APEMC.2015.7175400⟩ |
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hal-01239451v1
Conference papers
TLP-based Human Metal Model stress generator and analysis method of ESD generators Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. ⟨10.1109/EOSESD.2015.7314777⟩ |
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hal-00195362v1
Conference papers
High robustness PNP-based structure for the ESD protection of high voltage I/Os in an advanced smart power technology Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2007, BOSTON, United States. pp.359 |
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hal-02884107v1
Directions of work or proceedings
Proceedings of the 30th European Symposium on the reliability of electron devices, failure physics and analysis ESREF 2019, Sep 2019, Microelectronics Reliability, 100-101, pp.113498, 2019, ⟨10.1016/j.microrel.2019.113498⟩ |
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hal-01698397v1
Journal articles
Prediction of LIN communication robustness against EFT events using dedicated failure models Microelectronics Reliability, Elsevier, 2017, 76-77, pp.685 - 691. ⟨10.1016/j.microrel.2017.07.032⟩ |
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hal-01257965v1
Journal articles
Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015 Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1269-1270. ⟨10.1016/j.microrel.2015.09.028⟩ |
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hal-00941840v1
Journal articles
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress Microelectronics Reliability, Elsevier, 2013, 53 (9-11), pp.1278-1283. ⟨10.1016/j.microrel.2013.07.056⟩ |
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hal-01218702v1
Journal articles
Reliability of ESD protection devices designed in a 3D technology Microelectronics Reliability, Elsevier, 2014, Microelectronics Reliability, 54 (9), pp.2272-2277. ⟨10.1016/j.microrel.2014.07.136⟩ |
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hal-00397706v1
Journal articles
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure Microelectronics Reliability, Elsevier, 2005, 45 (9), pp.1415-1420 |
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hal-00722641v1
Conference papers
Transient Voltage Overshoots of High Voltage ESD Protections Based on Bipolar Transistors in Smart Power Technology Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2010, AUSTIN, United States. pp.253-256 |
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hal-00722644v1
Conference papers
Behavioral ESD Protection Modeling to perform System Level ESD Efficient Design Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), May 2012, SINGAPORE, Singapore. pp.401-404 |
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