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		Sort  Relevance  Author A→Z  Author Z→A  Title A→Z  Title Z→A  Date de publication croissante  Date de publication décroissante  Date de dépôt croissante  Date de dépôt décroissante Number 30 results per page 50 results per page 100 results per page × Merci d'indiquer la raison de votre demande Annuler Envoyer la demande  Tools  o  Export XML-TEI BibTeX EndNote CSV PDF RTF  Advanced export...  Syndicated feeds RSS ATOM
	hal-01555348v1  Conference papers Richard Monflier, Toshiyuki Tabata, Mégane Turpin, Amin Benyoucef, Fuccio Cristiano et al.  Evaluating depth distribution of excimer laser induced defects in silicon using micro-photoluminescence spectroscopy MRS Fall Meeting , MRS, Nov 2017, Boston, United States
	hal-01343978v3  Conference papers Richard Monflier, Toshiyuki Tabata, Fuccio Cristiano, Inès Toque-Tresonne, Fulvio Mazzamuto et al.  Defect investigation of excimer laser annealed silicon IEEE Nanotechnology Materials and Devices Conference, Oct 2016, Toulouse, France
	hal-01803955v2  Conference papers Richard Monflier, Hiba Rizk, Toshiyuki Tabata, Julien Roul, Simona Boninelli et al.  Defects Investigation in Nanosecond laser Annealed Crystalline Silicon: Identification and Localization 22nd International Conference on Ion Implantation Technology, Sep 2018, Würzburg, Germany. pp.4, ⟨10.1109/IIT.2018.8807933⟩
	hal-02140836v1  Conference papers Jean-François Bobo, Richard Monflier, Ludovic Salvagnac, Eléna Bedel-Pereira, Isabelle Séguy. Influence of in-situ x-ray exposure on the magnetotransport properties of NPB and MADN based blue OLED structures 14th International Conference on Organic Electronics (ICOE 2018), Jun 2018, Bordeaux, France
	hal-01690886v1  Conference papers Richard Monflier, Amin Benyoucef, Mégane Turpin, Fuccio Cristiano, Eléna Bedel-Pereira. Etude des défauts induits par recuit laser excimer sur silicium 20èmes Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2017), Nov 2017, Strasbourg, France. 1p
	tel-02162058v1  Theses Richard Monflier. Etude des défauts induits par recuit laser excimère dans le silicium Micro et nanotechnologies/Microélectronique. Université Toulouse 3 Paul Sabatier (UT3 Paul Sabatier), 2019. Français
	hal-02051962v1  Journal articles Eléna Bedel-Pereira, Richard Monflier, Mathieu Thene, Bernard Franc, Ludovic Salvagnac et al.  Magnetic Field Effects in X-Ray Damaged NPB and MADN OLEDs IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2019, 55 (2), pp.1-4. ⟨10.1109/TMAG.2018.2856590⟩
	hal-01245628v2  Conference papers Richard Monflier, Karine Isoird, Alain Cazarré, Josiane Tasselli, Alexandra Servel et al.  Diodes Schottky diamant fonctionnant à 200°C Symposium de Génie Electrique, G2Elab, Jun 2016, Grenoble, France
	hal-01921179v1  Journal articles Richard Daubriac, Emmanuel Scheid, Hiba Rizk, Richard Monflier, Sylvain Joblot et al.  A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si 1− x Ge x and Si layers Beilstein Journal of Nanotechnology, Karlsruhe Institute of Technology., 2018, 9, pp.1926 - 1939. ⟨10.3762/bjnano.9.184⟩
	hal-01618095v1  Journal articles Richard Monflier, Karine Isoird, Alain Cazarré, Josiane Tasselli, Alexandra Servel et al.  Diamond Schottky diodes operating at 473 K European Power Electronics and Drives Journal, Taylor & Francis, 2017, 27 (3), pp.118-124. ⟨10.1080/09398368.2017.1388625⟩
		Sort  Relevance  Author A→Z  Author Z→A  Title A→Z  Title Z→A  Date de publication croissante  Date de publication décroissante  Date de dépôt croissante  Date de dépôt décroissante Number 30 results per page 50 results per page 100 results per page  Tools  o  Export XML-TEI BibTeX EndNote CSV PDF RTF  Advanced export...  Syndicated feeds RSS ATOM