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hal-01245628v2  Conference papers
Richard Monflier, Karine Isoird, Alain Cazarré, Josiane Tasselli, Alexandra Servel et al.  Diodes Schottky diamant fonctionnant à 200°C
Symposium de Génie Electrique, G2Elab, Jun 2016, Grenoble, France
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hal-01618095v1  Journal articles
Richard Monflier, Karine Isoird, Alain Cazarré, Josiane Tasselli, Alexandra Servel et al.  Diamond Schottky diodes operating at 473 K
European Power Electronics and Drives Journal, Taylor & Francis, 2017, 27 (3), pp.118-124. ⟨10.1080/09398368.2017.1388625⟩
hal-01690886v1  Conference papers
Richard Monflier, Amin Benyoucef, Mégane Turpin, Fuccio Cristiano, Eléna Bedel-Pereira. Etude des défauts induits par recuit laser excimer sur silicium
20èmes Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2017), Nov 2017, Strasbourg, France. 1p
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hal-01803955v2  Conference papers
Richard Monflier, Hiba Rizk, Toshiyuki Tabata, Julien Roul, Simona Boninelli et al.  Defects Investigation in Nanosecond laser Annealed Crystalline Silicon: Identification and Localization
22nd International Conference on Ion Implantation Technology, Sep 2018, Würzburg, Germany. pp.4, ⟨10.1109/IIT.2018.8807933⟩
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hal-03012605v1  Journal articles
Maxime Levillayer, Sophie Duzellier, Inès Massiot, Thierry Nuns, Christophe Inguimbert et al.  Degradation study of InGaAsN PIN solar cell under 1 MeV electrons irradiation
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, In press
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hal-01343978v3  Conference papers
Richard Monflier, Toshiyuki Tabata, Fuccio Cristiano, Inès Toque-Tresonne, Fulvio Mazzamuto et al.  Defect investigation of excimer laser annealed silicon
IEEE Nanotechnology Materials and Devices Conference, Oct 2016, Toulouse, France
hal-02051962v1  Journal articles
Eléna Bedel-Pereira, Richard Monflier, Mathieu Thene, Bernard Franc, Ludovic Salvagnac et al.  Magnetic Field Effects in X-Ray Damaged NPB and MADN OLEDs
IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2019, 55 (2), pp.1-4. ⟨10.1109/TMAG.2018.2856590⟩
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hal-01921179v1  Journal articles
Richard Daubriac, Emmanuel Scheid, Hiba Rizk, Richard Monflier, Sylvain Joblot et al.  A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si 1− x Ge x and Si layers
Beilstein Journal of Nanotechnology, Karlsruhe Institute of Technology., 2018, 9, pp.1926 - 1939. ⟨10.3762/bjnano.9.184⟩
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tel-02162058v2  Theses
Richard Monflier. Etude des défauts induits par recuit laser excimère dans le silicium
Micro et nanotechnologies/Microélectronique. Université Paul Sabatier - Toulouse III, 2019. Français. ⟨NNT : 2019TOU30067⟩
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hal-03098053v1  Preprints, Working Papers, ...
Richard Monflier, Toshiyuki Tabata, Hiba Rizk, Julien Roul, Karim Huet et al.  Investigation of Oxygen penetration during UV Nanosecond Laser Annealing of Silicon at high energy densities
2021

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