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hal-01629118v1  Journal articles
Petru NotingherLudovic BoyerOlivier FruchierSerge AgnelAlain Toureille et al.  Analysis of Data Obtained Using the Thermal-Step Method on a MOS Structure—An Electrostatic Approach
IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers, 2010, 46 (3), pp.1144 - 1150. ⟨10.1109/TIA.2010.2045211⟩